Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction Using On-Chip Monitor Data
- Award ID(s):
- 1956313
- PAR ID:
- 10521460
- Publisher / Repository:
- 2023 IEEE International Test Conference
- Date Published:
- ISBN:
- 979-8-3503-4325-0
- Page Range / eLocation ID:
- 99 to 104
- Format(s):
- Medium: X
- Location:
- Anaheim, CA, USA
- Sponsoring Org:
- National Science Foundation
More Like this
No document suggestions found
An official website of the United States government

