An official website of the United States government
Elliptical retarders have important applications in interferometry and polarimetry, as well as imaging and display technologies. In this work, we discuss the traditional elliptical retarder decomposition using Pauli matrices as basis sets and then introduce a solution to the inverse problem: how an arbitrary elliptical retarder with desired eigenpolarizations and retardance can be constructed using a combination of linear and circular retarders. We present a simple design process, based on eigen-decomposition, with a solution determined by the intrinsic properties of each individual retarder layer. Additionally, a novel use of cholesteric liquid crystal polymer as a circular retarder is presented. Through simulation and experimental validation, we show cholesteric phase liquid crystal has an achromatic region of circular retardance at shorter wavelengths, outside of the Bragg regime. Finally, we verify our design process by fabricating and testing an elliptical retarder using both nematic and cholesteric phase liquid crystal polymers. The performance of the elliptical retarders shows excellent agreement with theory.
more »
« less
Patterned achromatic elliptical polarizer for short-wave infrared imaging polarimetry
Short-wave infrared (SWIR) imaging polarimetry has widespread applications in telecommunication, medical imaging, surveillance, remote-sensing, and industrial metrology. In this work, we design, fabricate, and test an achromatic SWIR elliptical polarizer, which is a key component of SWIR imaging polarimetry. The elliptical polarizer is made of a patterned linear polarizer and a patterned optical elliptical retarder. The linear polarizer is a wire grid polarizer. The elliptical retarder is constructed with three layers of nematic phase A-plate liquid crystal polymer (LCP) films with different fast axis orientations and physical film thicknesses. For each LCP layer, four arrays of hexagonal patterns with individual fast-axis orientations are realized utilizing selective linearly polarized ultraviolet (UV) irradiation on a photo-alignment polymer film. The Mueller matrices of the optical filters were measured in the wavelength range 1000 nm to 1600 nm and compared with theory. Our results demonstrate the functionality and quality of the patterned retarders with normalized analyzer vector parameter deviation below 7% over this wavelength range. To the best of our knowledge, this work represents the first polymer-based patterned elliptical polarizer for SWIR polarimetry imaging applications.
more »
« less
- Award ID(s):
- 2053754
- PAR ID:
- 10531298
- Publisher / Repository:
- Optical Society of America
- Date Published:
- Journal Name:
- Optics Express
- Volume:
- 30
- Issue:
- 2
- ISSN:
- 1094-4087; OPEXFF
- Format(s):
- Medium: X Size: Article No. 1249
- Size(s):
- Article No. 1249
- Sponsoring Org:
- National Science Foundation
More Like this
-
-
We demonstrate calibration and operation of a Mueller matrix imaging microscope using dual continuously rotating anisotropic mirrors for polarization state generation and analysis. The mirrors contain highly spatially coherent nanostructure slanted columnar titanium thin films deposited onto optically thick titanium layers on quartz substrates. The first mirror acts as polarization state image generator and the second mirror acts as polarization state image detector. The instrument is calibrated using samples consisting of laterally homogeneous properties such as straight-through-air, a clear aperture linear polarizer, and a clear aperture linear retarder waveplate. Mueller matrix images are determined for spatially varying anisotropic samples consisting of a commercially available (Thorlabs) birefringent resolution target and a spatially patterned titanium slanted columnar thin film deposited onto a glass substrate. Calibration and operation are demonstrated at a single wavelength (530 nm) only, while, in principle, the instrument can operate regardless of wavelength. We refer to this imaging ellipsometry configuration as rotating-anisotropic-mirror-sample-rotating-anisotropic-mirror ellipsometry (RAM-S-RAM-E).more » « less
-
We demonstrate calibration and operation of a single wavelength (660 nm) Mueller matrix ellipsometer in normal transmission configuration using dual continuously rotating anisotropic mirrors. The mirrors contain highly spatially coherent nanostructure slanted columnar titanium thin films deposited onto optically thick gold layers on glass substrates. Upon rotation around the mirror normal axis, sufficient modulation of the Stokes parameters of light reflected at oblique angle of incidence is achieved. Thereby, the mirrors can be used as a polarization state generator and polarization state analyzer in a generalized ellipsometry instrument. A Fourier expansion approach is found sufficient to render and calibrate the effects of the mirror rotations onto the polarized light train within the ellipsometer. The Mueller matrix elements of a set of anisotropic samples consisting of a linear polarizer and a linear retarder are measured and compared with model data, and very good agreement is observed.more » « less
-
Polarimetry is generally used to determine the polarization state of light beams in various research fields, such as biomedicine, astronomy, and materials science. In particular, the rotating quarter-wave plate polarimeter is an inexpensive and versatile option used in several single-wavelength applications to determine the four Stokes parameters. Extending this technique to broadband spectroscopic measurements is of great scientific interest since the information on light polarization is highly sensitive to anisotropic phenomena. However, the need for achromatic polarizing elements, especially quarter-wave plates, requires special attention in their modeling. In this study, we implemented a rotating retarder spectropolarimeter for broadband measurements using a commercially available quasi-achromatic biplate retarder over the visible range. Here, we present a comprehensive approach for troubleshooting this type of spectropolarimeter through the observation of artifacts stemming from the standard single-plate retarder model. Then, we derive a more suitable model for a quasi-achromatic retarder consisting of a biplate junction. This new biplate model requires knowledge of the intrinsic dispersive properties of the biplate, namely the equivalent retardance, fast axis tilt, and rotatory angle. Hence, in this study, we also show a self-consistent methodology to determine these biplate properties using the same polarimeter apparatus so that accurate Stokes parameters can be determined independently. Finally, the comparison of data generated with the standard single-plate and new biplate models shows a significant improvement in the measurement precision of the investigated polarization states, which confirms that remodeling the retarder for reliable spectropolarimetry is necessary.more » « less
-
As a three-dimensional topological phase of matter, Weyl semimetals possess extremely large gyrotropic optical response in the mid-infrared region, leading to the strong chiral anomaly. This study proposes a circular polarizer design with a double-WSM-layer structure. It is theoretically shown that the proposed polarizer possesses a high circular polarization efficiency and high average transmittance in the wavelength region from 9 µm to 15 µm at incidence angles up to 50°. The modified 4 × 4 matrix method is used to calculate the circularly polarized transmittance of Weyl semimetals in thin-film or multilayer structures. The temperature dependence on the transmittance is also examined to demonstrate the flexibility of the proposed polarizer in a varying temperature environment. This study reveals the technological prospect that Weyl semimetals are promising candidates for high-performance circular polarizers in infrared spectroscopy and polarimetry.more » « less
