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Title: Interpretation of the stress dip test as a means of characterizing backstress: Experiments and backstress-aided crystal plasticity modeling of polycrystalline tantalum
Award ID(s):
2147126 2147122
PAR ID:
10538357
Author(s) / Creator(s):
; ; ; ;
Publisher / Repository:
Elsevier
Date Published:
Journal Name:
International Journal of Plasticity
Volume:
181
Issue:
C
ISSN:
0749-6419
Page Range / eLocation ID:
104089
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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