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Signal Integrity Simulations of 4JL Gate Pulses From 4 K to 50 K
- Award ID(s):
- 2124453
- PAR ID:
- 10579145
- Publisher / Repository:
- IEEE
- Date Published:
- Journal Name:
- IEEE Transactions on Applied Superconductivity
- Volume:
- 35
- Issue:
- 5
- ISSN:
- 1051-8223
- Page Range / eLocation ID:
- 1 to 6
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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