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This content will become publicly available on August 1, 2026

Title: Signal Integrity Simulations of 4JL Gate Pulses From 4 K to 50 K
Award ID(s):
2124453
PAR ID:
10579145
Author(s) / Creator(s):
; ; ; ;
Publisher / Repository:
IEEE
Date Published:
Journal Name:
IEEE Transactions on Applied Superconductivity
Volume:
35
Issue:
5
ISSN:
1051-8223
Page Range / eLocation ID:
1 to 6
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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