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Abstract Spatially resolved in situ transmission electron microscopy (TEM), equipped with direct electron detection systems, is a suitable technique to record information about the atom-scale dynamics with millisecond temporal resolution from materials. However, characterizing dynamics or fluxional behavior requires processing short time exposure images which usually have severely degraded signal-to-noise ratios. The poor signal-to-noise associated with high temporal resolution makes it challenging to determine the position and intensity of atomic columns in materials undergoing structural dynamics. To address this challenge, we propose a noise-robust, processing approach based on blob detection, which has been previously established for identifying objects in images in the community of computer vision. In particular, a blob detection algorithm has been tailored to deal with noisy TEM image series from nanoparticle systems. In the presence of high noise content, our blob detection approach is demonstrated to outperform the results of other algorithms, enabling the determination of atomic column position and its intensity with a higher degree of precision.
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This content will become publicly available on February 28, 2026
Visualizing nanoparticle surface dynamics and instabilities enabled by deep denoising
Materials functionalities may be associated with atomic-level structural dynamics occurring on the millisecond timescale. However, the capability of electron microscopy to image structures with high spatial resolution and millisecond temporal resolution is often limited by poor signal-to-noise ratios. With an unsupervised deep denoising framework, we observed metal nanoparticle surfaces (platinum nanoparticles on cerium oxide) in a gas environment with time resolutions down to 10 milliseconds at a moderate electron dose. On this timescale, many nanoparticle surfaces continuously transition between ordered and disordered configurations. Stress fields can penetrate below the surface, leading to defect formation and destabilization, thus making the nanoparticle fluxional. Combining this unsupervised denoiser with in situ electron microscopy greatly improves spatiotemporal characterization, opening a new window for the exploration of atomic-level structural dynamics in materials.
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- PAR ID:
- 10580617
- Publisher / Repository:
- AAAS
- Date Published:
- Journal Name:
- Science
- Volume:
- 387
- Issue:
- 6737
- ISSN:
- 0036-8075
- Page Range / eLocation ID:
- 949 to 954
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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