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Defect-based single photon emitters play an important role in quantum information technologies. Quantum emitters in technologically mature direct wide bandgap semiconductors, such as nitrides, are attractive for on-chip photonic integration. GaN has recently been reported to host bright and photostable defect single photon emitters in the 600–700 nm wavelength range. Spectral diffusion caused by local electric field fluctuation around the emitter limits the photon indistinguishability, which is a key requirement for quantum applications. In this work, we investigate the spectral diffusion properties of GaN defect emitters integrated with a solid immersion lens, employing both spectral domain and time domain techniques through spectroscopy and photon autocorrelation measurements at cryogenic temperature. Our results show that the GaN defect emitter at 10 K exhibits a Gaussian line shape with a linewidth of ∼1 meV while the spectral diffusion characteristic time falls within the range of a few hundred nanoseconds to a few microseconds. We study the dependency of the spectral diffusion rate and Gaussian linewidth on the excitation laser power. Our work provides insight into the ultrafast spectral diffusion in GaN defect-based single photon emitter systems and contributes toward harnessing the potential of these emitters for applications, especially for indistinguishable single photon generation.
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Quantum emitters in aluminum nitride induced by heavy ion irradiation
The integration of solid-state single-photon sources with foundry-compatible photonic platforms is crucial for practical and scalable quantum photonic applications. This study explores aluminum nitride (AlN) as a material with properties highly suitable for integrated on-chip photonics and the ability to host defect-center related single-photon emitters. We have conducted a comprehensive analysis of the creation of single-photon emitters in AlN, utilizing heavy ion irradiation and thermal annealing techniques. Subsequently, we have performed a detailed analysis of their photophysical properties. Guided by theoretical predictions, we assessed the potential of Zirconium (Zr) ions to create optically addressable spin defects and employed Krypton (Kr) ions as an alternative to target lattice defects without inducing chemical doping effects. With a 532 nm excitation wavelength, we found that single-photon emitters induced by ion irradiation were primarily associated with vacancy-type defects in the AlN lattice for both Zr and Kr ions. The density of these emitters increased with ion fluence, and there was an optimal value that resulted in a high density of emitters with low AlN background fluorescence. Under a shorter excitation wavelength of 405 nm, Zr-irradiated AlN exhibited isolated point-like emitters with fluorescence in the spectral range theoretically predicted for spin-defects. However, similar defects emitting in the same spectral range were also observed in AlN irradiated with Kr ions as well as in as-grown AlN with intrinsic defects. This result is supportive of the earlier theoretical predictions, but at the same time highlights the difficulties in identifying the sought-after quantum emitters with interesting properties related to the incorporation of Zr ions into the AlN lattice by fluorescence alone. The results of this study largely contribute to the field of creating quantum emitters in AlN by ion irradiation and direct future studies emphasizing the need for spatially localized Zr implantation and testing for specific spin properties.
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- Award ID(s):
- 2015025
- PAR ID:
- 10584263
- Publisher / Repository:
- American Institute of Physics
- Date Published:
- Journal Name:
- APL Quantum
- Volume:
- 1
- Issue:
- 3
- ISSN:
- 2835-0103
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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