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Title: Rapid-Acquisition FEM – Grappling the Noise
Fluctuation Electron Microscopy (FEM) is a versatile technique for detecting subtle traces of ordering in amorphous and glassy materials [1–4]. However, quantitative results remained elusive, mainly because experimental variance data disagree with theory by several orders of magnitude. The reasons for this discrepancy are still a mystery. We present a preliminary report on what we know.  more » « less
Award ID(s):
1906367
PAR ID:
10589391
Author(s) / Creator(s):
; ; ; ; ;
Publisher / Repository:
Microscopy and Microanalysis
Date Published:
Journal Name:
Microscopy and Microanalysis
Volume:
29
Issue:
Supplement_1
ISSN:
1431-9276
Page Range / eLocation ID:
1856 to 1858
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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