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Deleting data instantly from NAND flash memories incurs hefty overheads, and increases wear level. Existing solutions involve unlinking the physical page addresses making data inaccessible through standard interfaces, but they carry the risk of data leakage. An all-zero-in-place data overwrite has been proposed as a countermeasure, but it applies only to SLC flash memories. This paper introduces an instant page data sanitization method for MLC flash memories that prevents leakage of deleted information without any negative effects on valid data in shared pages. We implement and evaluate the proposed method on commercial 2D and 3D NAND flash memory chips.
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This content will become publicly available on August 28, 2026
Page-Overwrite Data Sanitization in 3D NAND Flash: Challenges, Feasibility, and the PULSE Solution
Instant data deletion (or sanitization) in NAND flash devices is essential for achieving data privacy, but it remains challenging due to the mismatch between erase and write granularities, which leads to high overhead and accelerated wear. While page-overwrite-based instant data sanitization has proven effective for 2D NAND, its applicability to 3D NAND is limited due to the unique sub-block architecture. In this study, we experimentally evaluate page-overwrite-based sanitization on commercial 3D NAND flash memory chips and uncover significant threshold voltage disturbances in erased cells on adjacent pages within the same layer but across different sub-blocks. Our key findings reveal that page-overwrite sanitization increases the median raw bit error rate (RBER) beyond correction limits (exceeding 0.93%) in Floating-Gate (FG) Single-Level Cell (SLC) technology, whereas Charge-Trap (CT) SLC 3D NAND flash memories exhibit higher robustness. In Triple-Level Cell (TLC) 3D NAND, page-overwrite sanitization proves impractical, with the median RBER of ∼13% for FG and ∼5% for CT devices. To overcome these challenges, we proposePULSE, a low-disturbance sanitization technique that balances sanitization efficiency ({{\eta }_{san}}) and data integrity (RBER). Experimental results show that PULSE eliminates RBER increases in SLC devices and reduces the median RBER to below 0.57% for FG and 0.79% for CT in fresh TLC blocks, demonstrating its practical viability for 3D NAND flash sanitization.
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- PAR ID:
- 10633397
- Publisher / Repository:
- ACM
- Date Published:
- Journal Name:
- ACM Transactions on Embedded Computing Systems
- ISSN:
- 1539-9087
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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