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Radhakrishnan, A. ; Yang, K. D. ; Belkin, M. ; Uhler, C. ( , Deep Phenomena Workshop, International Conference on Machine Learning)
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Overfitting or perfect fitting? Risk bounds for classification and regression rules that interpolateBelkin, M ; Hsu, D ; Mitra, P ( , Neural Information Processing Systems)
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Belkin, A. ; Belkin, M. ; Vakaryuk, V. ; Khlebnikov, S. ; Bezryadin, A. ( , Physical Review X)
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Gomez-Diaz, J. S. ; Tymchenko, M. ; Lee, J. ; Belkin, M. A. ; Alù, Andrea ( , Physical Review B)
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