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Title: Reliability Analysis of a Delay-Locked Loop Under HCI and BTI Degradation
This paper studies the impact of hot carrier injection and bias temperature instability on a mixed-signal delay locked loop, at the block and system levels. Aging affects delays on the reset line of the phase detector, degrading sensitivity to input phase differences. Aging also increases threshold voltage mismatch in the charge pump, causing the control voltage of the voltage-controlled delay line to drift, reducing the acquisition time. Numerical results on a 45nm CMOS process are presented.  more » « less
Award ID(s):
1714805
PAR ID:
10110525
Author(s) / Creator(s):
;
Date Published:
Journal Name:
IEEE Interantional Reliability Physics Symposium
Page Range / eLocation ID:
1 to 6
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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