A low-energy hardware implementation of deep belief network (DBN) architecture is developed using near-zero energy barrier probabilistic spin logic devices (p-bits), which are modeled to real- ize an intrinsic sigmoidal activation function. A CMOS/spin based weighted array structure is designed to implement a restricted Boltzmann machine (RBM). Device-level simulations based on precise physics relations are used to validate the sigmoidal relation between the output probability of a p-bit and its input currents. Characteristics of the resistive networks and p-bits are modeled in SPICE to perform a circuit-level simulation investigating the performance, area, and power consumption tradeoffs of the weighted array. In the application-level simulation, a DBN is implemented in MATLAB for digit recognition using the extracted device and circuit behavioral models. The MNIST data set is used to assess the accuracy of the DBN using 5,000 training images for five distinct network topologies. The results indicate that a baseline error rate of 36.8% for a 784x10 DBN trained by 100 samples can be reduced to only 3.7% using a 784x800x800x10 DBN trained by 5,000 input samples. Finally, Power dissipation and accuracy tradeoffs for probabilistic computing mechanisms using resistive devices are identified.
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Modular Simulation Framework for Process Variation Analysis of MRAM-based Deep Belief Networks
Magnetic Random-Access Memory (MRAM) based p-bit neuromorphic computing devices are garnering increasing interest as a means to compactly and efficiently realize machine learning operations in Restricted Boltzmann Machines (RBMs). When embedded within an RBM resistive crossbar array, the p-bit based neuron realizes a tunable sigmoidal activation function. Since the stochasticity of activation is dependent on the energy barrier of the MRAM device, it is essential to assess the impact of process variation on the voltage-dependent behavior of the sigmoid function. Other influential performance factors arise from varying energy barriers on power consumption requiring a simulation environment to facilitate the multi-objective optimization of device and network parameters. Herein, transportable Python scripts are developed to analyze the output variation under changes in device dimensions on the accuracy of machine learning applications. Evaluation with RBM circuits using the MNIST dataset reveal impacts and limits for processing variation of device fabrication in terms of the resulting energy vs. accuracy tradeoffs, and the resulting simulation framework is available via a Creative Commons license.
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- Award ID(s):
- 1739635
- NSF-PAR ID:
- 10163075
- Date Published:
- Journal Name:
- IEEE SoutheastCon 2019
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
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