Abstract Amorphous thin films of Ti doped GeO2are of interest for coatings of the mirrors in gravitational wave detectors (GWDs) due to their low internal friction (Vajenteet al2021Phys. Rev. Lett.127071101). The addition of Ti to amorphous GeO2(a-GeO2) enables tailoring of the optical and structural properties of the mixtures. However, the specific modifications that occur in the amorphous network with the addition of Ti are not known. In this work, x-ray photoelectron spectroscopy is used to identify modifications to the bonding of Ge and Ti atoms in mixtures of Ti dopeda-GeO2with different Ti cation content. The formation of (Ti–O–Ge) bonds is evidenced from: (1) the presence of a peak which intensity increases with Ti content and causes a shift to lower binding energy (BE) of the core level O 1speak; (2) the shift to higher BE of the Ti 2p3/2peak and a decrease in the energy split; and (3) the shift to lower BE of the Ge 3d5/2peak and increase in the energy split. These changes reflect modifications to the bonding when Ge replaces Ti in Ti–O–Ti bonds and Ti replaces Ge in Ge–O–Ge bonds due to their difference in electronegativity. A decrease in the O–O nearest-neighbour distance due to the incorporation of Ti atom is also observed from the broadening of the valence band spectra. The results show the 0.44 Ti dopeda-GeO2mixture has a balance between the (Ti–O–Ge) and the (Ge–O–Ge) networks, not observed in Ti poor and Ti rich mixtures. This finding could have important consequences in the optimisation of amorphous Ti dopeda-GeO2mixtures for low internal friction coatings of GWDs.
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Structure and morphology of low mechanical loss TiO 2 -doped Ta 2 O 5
The exceptional stability required from high finesse optical cavities and high precision interferometers is fundamentally limited by Brownian motion noise in the interference coatings of the cavity mirrors. In amorphous oxide coatings these thermally driven fluctuations are dominant in the high index layer compared to those in the low index SiO2layer in the stack. We present a systematic study of the evolution of the structural and optical properties of ion beam sputtered TiO2-doped Ta2O5films with annealing temperature. We show that low mechanical loss in TiO2-doped Ta2O5with a Ti cation ratio = 0.27 is associated with a material that consists of a homogeneous titanium-tantalum-oxygen mixture containing a low density of nanometer sized Ar-filled voids. When the Ti cation ratio is 0.53, phase separation occurs leading to increased mechanical loss. These results suggest that amorphous mixed oxides with low mechanical loss could be identified by considering the thermodynamics of ternary phase formation.
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- PAR ID:
- 10169020
- Publisher / Repository:
- Optical Society of America
- Date Published:
- Journal Name:
- Optical Materials Express
- Volume:
- 10
- Issue:
- 7
- ISSN:
- 2159-3930
- Format(s):
- Medium: X Size: Article No. 1687
- Size(s):
- Article No. 1687
- Sponsoring Org:
- National Science Foundation
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