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Title: Data retention and low voltage operation of Al 2 O 3 /Hf 0.5 Zr 0.5 O 2 based ferroelectric tunnel junctions
NSF-PAR ID:
10171459
Author(s) / Creator(s):
; ; ; ; ;
Publisher / Repository:
IOP Publishing
Date Published:
Journal Name:
Nanotechnology
Volume:
31
Issue:
39
ISSN:
0957-4484
Page Range / eLocation ID:
Article No. 39LT01
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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