Held, R., Mairoser, T., Melville, A., Mundy, J. A., Holtz, M. E., Hodash, D., Wang, Z., Heron, J. T., Dacek, S. T., Holländer, B., Muller, D. A., and Schlom, D. G.. Exploring the intrinsic limit of the charge-carrier-induced increase of the Curie temperature of Lu- and La-doped EuO thin films. Retrieved from https://par.nsf.gov/biblio/10227982. Physical Review Materials 4.10 Web. doi:10.1103/PhysRevMaterials.4.104412.

Held, R., Mairoser, T., Melville, A., Mundy, J. A., Holtz, M. E., Hodash, D., Wang, Z., Heron, J. T., Dacek, S. T., Holländer, B., Muller, D. A., & Schlom, D. G.. Exploring the intrinsic limit of the charge-carrier-induced increase of the Curie temperature of Lu- and La-doped EuO thin films. Physical Review Materials, 4 (10). Retrieved from https://par.nsf.gov/biblio/10227982. https://doi.org/10.1103/PhysRevMaterials.4.104412

Held, R., Mairoser, T., Melville, A., Mundy, J. A., Holtz, M. E., Hodash, D., Wang, Z., Heron, J. T., Dacek, S. T., Holländer, B., Muller, D. A., and Schlom, D. G.. "Exploring the intrinsic limit of the charge-carrier-induced increase of the Curie temperature of Lu- and La-doped EuO thin films". Physical Review Materials 4 (10). Country unknown/Code not available. https://doi.org/10.1103/PhysRevMaterials.4.104412. https://par.nsf.gov/biblio/10227982.

@article{osti_10227982,
place = {Country unknown/Code not available}, title = {Exploring the intrinsic limit of the charge-carrier-induced increase of the Curie temperature of Lu- and La-doped EuO thin films}, url = {https://par.nsf.gov/biblio/10227982}, DOI = {10.1103/PhysRevMaterials.4.104412}, abstractNote = {}, journal = {Physical Review Materials}, volume = {4}, number = {10}, author = {Held, R. and Mairoser, T. and Melville, A. and Mundy, J. A. and Holtz, M. E. and Hodash, D. and Wang, Z. and Heron, J. T. and Dacek, S. T. and Holländer, B. and Muller, D. A. and Schlom, D. G.}, }