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Title: Full-Speed Testing of Silicon Photonic Electro-Optic Modulators from Picowatt-level Scattered Light
We demonstrate a technique for measuring the full-speed performance of integrated modulators from ultraweak surface-coupled and scattered light. This can enable rapid characterization of unpackaged, high-speed wafer-scale integrated photonics without test ports or special fabrication.  more » « less
Award ID(s):
1640968
PAR ID:
10282996
Author(s) / Creator(s):
; ; ;
Date Published:
Journal Name:
Optical Fiber Communication Conference
Page Range / eLocation ID:
Th4A.7
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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