Sub-resonance tapping (SRT) mode of atomic force microscopy (AFM) enables researchers to image surfaces with well-controlled load forces and to collect maps of multiple physical properties of samples. The major bottleneck of this mode is a relatively low scan speed compared to other scanning modes. This paper presents a novel control algorithm that substantially improves the scanning speed over the standard SRT. We propose naming the new modality Trajectory Tracking SRT (TT-SRT). In contrast with the standard SRT control, TT-SRT uses the feedback within every single touch of the sample by the AFM probe. To demonstrate the advantage of TT-SRT, we conduct scans on a variety of samples with differing topologies, roughnesses, and mechanical properties. Each sample region is scanned with both standard SRT and TT-SRT at the same set of speeds. The control gains are tuned before each scan for maximum performance in each mode. Performance is evaluated by selecting a given level of image quality and finding the maximum speed that can be achieved by each algorithm. We find that with increased demand for data quality, the utility of TT-SRT becomes more apparent; for example, the speed of TT-SRT can be ten times faster or more than standard SRT for a reasonable expectation of data quality.
This content will become publicly available on May 19, 2024
Large-range high-speed dynamic-mode atomic force microscope imaging: adaptive tapping towards minimal force
Abstract This paper presents a software-hardware integrated approach to high-speed large-range dynamic mode imaging of atomic force microscope (AFM). High speed AFM imaging is needed to interrogate dynamic processes at nanoscale such as cellular interactions and polymer crystallization process. High-speed dynamic-modes such as tapping-mode AFM imaging is challenging as the probe tapping motion is sensitive to the highly nonlinear probe-sample interaction during the imaging process. The existing hardware-based approach via bandwidth enlargement, however, results in a substantially reduction of imaging area that can be covered. Contrarily, control (algorithm)-based approach, for example, the recently developed adaptive multiloop mode (AMLM) technique, has demonstrated its efficacy in increasing the tapping-mode imaging speed without loss of imaging size. Further improvement, however, has been limited by the hardware bandwidth and online signal processing speed and computation complexity.Thus, in this paper, the AMLM technique is further enhanced to optimize the probe tapping regulation and integrated with a field programmable gate array (FPGA) platform to further increase the imaging speed without loss of imaging quality and range. Experimental implementation of the proposed approach demonstrates that the high-quality imaging can be achieved at a high-speed scanning rate of 100 Hz and higher, and over a large imaging area of over 20 µm.
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- NSF-PAR ID:
- 10420373
- Date Published:
- Journal Name:
- Nanotechnology
- ISSN:
- 0957-4484
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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