Kalinin, Sergei V., Ziatdinov, Maxim, Spurgeon, Steven R., Ophus, Colin, Stach, Eric A., Susi, Toma, Agar, Josh, and Randall, John. Deep learning for electron and scanning probe microscopy: From materials design to atomic fabrication. Retrieved from https://par.nsf.gov/biblio/10394370. MRS Bulletin 47.9 Web. doi:10.1557/s43577-022-00413-3.

Kalinin, Sergei V., Ziatdinov, Maxim, Spurgeon, Steven R., Ophus, Colin, Stach, Eric A., Susi, Toma, Agar, Josh, & Randall, John. Deep learning for electron and scanning probe microscopy: From materials design to atomic fabrication. MRS Bulletin, 47 (9). Retrieved from https://par.nsf.gov/biblio/10394370. https://doi.org/10.1557/s43577-022-00413-3

Kalinin, Sergei V., Ziatdinov, Maxim, Spurgeon, Steven R., Ophus, Colin, Stach, Eric A., Susi, Toma, Agar, Josh, and Randall, John. "Deep learning for electron and scanning probe microscopy: From materials design to atomic fabrication". MRS Bulletin 47 (9). Country unknown/Code not available. https://doi.org/10.1557/s43577-022-00413-3. https://par.nsf.gov/biblio/10394370.

@article{osti_10394370,
place = {Country unknown/Code not available}, title = {Deep learning for electron and scanning probe microscopy: From materials design to atomic fabrication}, url = {https://par.nsf.gov/biblio/10394370}, DOI = {10.1557/s43577-022-00413-3}, abstractNote = {}, journal = {MRS Bulletin}, volume = {47}, number = {9}, author = {Kalinin, Sergei V. and Ziatdinov, Maxim and Spurgeon, Steven R. and Ophus, Colin and Stach, Eric A. and Susi, Toma and Agar, Josh and Randall, John}, }