When deep neural network (DNN) is extensively utilized for edge AI (Artificial Intelligence), for example, the Internet of things (IoT) and autonomous vehicles, it makes CMOS (Complementary Metal Oxide Semiconductor)-based conventional computers suffer from overly large computing loads. Memristor-based devices are emerging as an option to conduct computing in memory for DNNs to make them faster, much more energy efficient, and accurate. Despite having excellent properties, the memristor-based DNNs are yet to be commercially available because of Stuck-At-Fault (SAF) defects. A Mapping Transformation (MT) method is proposed in this paper to mitigate Stuck-at-Fault (SAF) defects from memristor-based DNNs. First, the weight distribution for the VGG8 model with the CIFAR10 dataset is presented and analyzed. Then, the MT method is used for recovering inference accuracies at 0.1% to 50% SAFs with two typical cases, SA1 (Stuck-At-One): SA0 (Stuck-At-Zero) = 5:1 and 1:5, respectively. The experiment results show that the MT method can recover DNNs to their original inference accuracies (90%) when the ratio of SAFs is smaller than 2.5%. Moreover, even when the SAF is in the extreme condition of 50%, it is still highly efficient to recover the inference accuracy to 80% and 21%. What is more, the MT method acts as a regulator to avoid energy and latency overhead generated by SAFs. Finally, the immunity of the MT Method against non-linearity is investigated, and we conclude that the MT method can benefit accuracy, energy, and latency even with high non-linearity LTP = 4 and LTD = −4.
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Reliability Improvement in RRAM-based DNN for Edge Computing
Recently, the Resistive Random Access Memory (RRAM) has been paid more attention for edge computing applications in both academia and industry, because it offers power efficiency and low latency to perform the complex analog in-situ matrix-vector multiplication – the most fundamental operation of Deep Neural Networks (DNNs). But the Stuck at Fault (SAF) defect makes the RRAM unreliable for the practical implementation. A differential mapping method (DMM) is proposed in this paper to improve reliability by mitigate SAF defects from RRAM-based DNNs. Firstly, the weight distribution for the VGG8 model with the CIFAR10 dataset is presented and analyzed. Then the DMM is used for recovering the inference accuracies at 0.1% to 50% SAFs. The experiment results show that the DMM can recover DNNs to their original inference accuracies (90%), when the ratio of SAFs is smaller than 7.5%. And even when the SAF is in the extreme condition 50%, it is still highly efficient to recover the inference accuracy to 80%. What is more, the DMM is a highly reliable regulator to avoid power and timing overhead generated by SAFs.
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- NSF-PAR ID:
- 10397911
- Date Published:
- Journal Name:
- 2022 IEEE International Symposium on Circuits and Systems (ISCAS)
- Page Range / eLocation ID:
- 581 to 585
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Conference Paper:
- https://doi.org/10.1109/ISCAS48785.2022.9937260
