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Title: Reliability Improvement in RRAM-based DNN for Edge Computing
Recently, the Resistive Random Access Memory (RRAM) has been paid more attention for edge computing applications in both academia and industry, because it offers power efficiency and low latency to perform the complex analog in-situ matrix-vector multiplication – the most fundamental operation of Deep Neural Networks (DNNs). But the Stuck at Fault (SAF) defect makes the RRAM unreliable for the practical implementation. A differential mapping method (DMM) is proposed in this paper to improve reliability by mitigate SAF defects from RRAM-based DNNs. Firstly, the weight distribution for the VGG8 model with the CIFAR10 dataset is presented and analyzed. Then the DMM is used for recovering the inference accuracies at 0.1% to 50% SAFs. The experiment results show that the DMM can recover DNNs to their original inference accuracies (90%), when the ratio of SAFs is smaller than 7.5%. And even when the SAF is in the extreme condition 50%, it is still highly efficient to recover the inference accuracy to 80%. What is more, the DMM is a highly reliable regulator to avoid power and timing overhead generated by SAFs.
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Award ID(s):
Publication Date:
Journal Name:
2022 IEEE International Symposium on Circuits and Systems (ISCAS)
Page Range or eLocation-ID:
581 to 585
Sponsoring Org:
National Science Foundation
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