An official website of the United States government
Radiation susceptibility of electronics has always been about probing electrical properties in either transient or time-accumulated phenomena. As the size and complexity of electronic chips or systems increase, detection of the most vulnerable regions becomes more time consuming and challenging. In this study, we hypothesize that localized mechanical stress, if overlapping electrically sensitive regions, can make electronic devices more susceptible to radiation. Accordingly, we develop an indirect technique to map mechanical and electrical hotspots to identify radiation-susceptible regions of the operational amplifier AD844 to ionizing radiation. Mechanical susceptibility is measured using pulsed thermal phase analysis via lock-in thermography and electrical biasing is used to identify electrically relevant regions. A composite score of electrical and mechanical sensitivity was constructed to serve as a metric for ionizing radiation susceptibility. Experimental results, compared against the literature, indicate effectiveness of the new technique in the rapid detection of radiation-vulnerable regions. The findings could be attractive for larger systems, for which traditional analysis would take —two to three orders of magnitude more time to complete. However, the indirect nature of the technique makes the study more approximate and in need for more consistency and validation efforts.
more »
« less
Heuristic Detection of the Most Vulnerable Regions in Electronic Devices for Radiation Survivability
As electronic systems become larger and more complex, detection of the most vulnerable regions (MVR) to radiation exposure becomes more difficult and time consuming. We present a heuristic approach where the mechanical and thermal aspects of devices are exploited to quickly identify MVRs. Our approach involves the topological mapping of two device conditions. The first condition identifies regions with the highest mechanical strain or density of defects and interfaces via thermal wave probing and phase analysis. The second condition identifies regions with high electrical field. It is hypothesized that the region with the highest thermal wave penetration resistance and electrical field will exhibit the highest sensitivity to incoming radiation for single events and potentially, total ionizing dose. Our approach implements a simplistic design that improves analysis time by ∼2–3 orders of magnitude over current radiation sensitivity mapping methods. The design is demonstrated on the well-studied operational amplifier LM124, which shows agreement with the literature in identifying sensitive transistors–QR1, Q9, and Q18–with relatively high phase percentile values (>70%) and ΔT percentiles (>50%), satisfying conditions for elevated radiation susceptibility. This is followed by experimental results on a static random access memory (HM-6504) and a Xilinx Artix-7 35 T system on a chip.
more »
« less
- Award ID(s):
- 2015795
- PAR ID:
- 10399308
- Date Published:
- Journal Name:
- ECS Journal of Solid State Science and Technology
- Volume:
- 11
- Issue:
- 8
- ISSN:
- 2162-8769
- Page Range / eLocation ID:
- 085008
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
More Like this
-
-
We report thermal and mechanical responses accompanying electrical characteristics of depletion mode GaN high electron mobility transistors exposed to gamma radiation up to 107rads. Changes in the lattice strain and temperature were simultaneously characterized by changes in the phonon frequency of E2(high) and A1(LO) from the on-state and unpowered/pinched off reference states. Lower doses of radiation improved electrical properties; however, degradation initiated at about 106rads. We observed about 16% decrease in the saturation current and 6% decrease in the transconductance at the highest dose. However, a leakage current increase by three orders of magnitude was the most notable radiation effect. We observed temperature increase by 40% and mechanical stress increase by a factor of three at a dose of 107rads compared to the pristine devices. Spatial mapping of mechanical stress along the channel identifies the gate region as a mechanically affected area, whereas the thermal degradation was mostly uniform. Transmission electron microscopy showed contrast changes reflecting a high vacancy concentration in the gate region. These findings suggest that localized stress (mechanical hotspots) may increase vulnerability to radiation damage by accommodating higher concentration of defects that promote the leakage current.more » « less
-
The demand for high power and high-frequency radio frequency (RF) power amplifiers makes AlGaN/GaN high electron mobility transistors (HEMTs) an attractive option due to their large critical field, high saturation velocity, and reduced device footprint as compared to Si-based counterparts. However, due to the high operating power densities, intense device self-heating occurs, which degrades the electrical performance and compromises the device’s reliability. The self-heating behavior of AlGaN/GaN HEMTs is known to be not solely a function of the dissipated power but is highly bias-dependent. As the operation of RF power amplifiers involves alteration of the device operation from fully-open to pinched-off channel conditions, it is critical to experimentally map the full channel temperature profile as a function of bias conditions. However, such measurement is difficult using optical thermography techniques due to the lack of optical access underneath the gate electrode, where the peak temperature is expected to occur. To address this challenge, an AlGaN/GaN HEMT employing a transparent gate made of indium tin oxide (ITO) was fabricated, which enables full channel temperature mapping using Raman spectroscopy. It was found that the maximum channel temperature rise under a partially pinched-off condition is more than ∼93% higher than that for an open channel condition, although both conditions would lead to an identical power dissipation level. The channel peak temperature probed in an ITO-gated device (underneath the gate) is ∼33% higher than the highest channel temperature that can be measured for a standard metal-gated AlGaN/GaN HEMT (i.e., next to the metal gate structure) operating under an identical bias condition. This indicates that one may significantly underestimate the device’s thermal resistance when solely relying on performing thermal characterization on the optically accessible region of a standard AlGaN/GaN HEMT. The outcomes of this study are important in terms of conducting a more accurate lifetime prediction of the device lifetime and designing thermal management solutions.more » « less
-
ABSTRACT Low-mass X-ray binaries have long been theorized as potential sources of continuous gravitational-wave radiation, yet there is no observational evidence from recent LIGO/Virgo observing runs. Even for the theoretically ‘loudest’ source, Sco X-1, the upper limit on gravitational-wave strain has been pushed ever lower. Such searches require precise measurements of the source properties for sufficient sensitivity and computational feasibility. Collating over 20 yr of high-quality spectroscopic observations of the system, we present a precise and comprehensive ephemeris for Sco X-1 through radial velocity measurements, performing a full homogeneous re-analysis of all relevant data sets and correcting previous analyses. Our Bayesian approach accounts for observational systematics and maximizes not only precision, but also the fidelity of uncertainty estimates – crucial for informing principled continuous-wave searches. Our extensive data set and analysis also enables us to construct the highest signal-to-noise ratio, highest resolution phase-averaged spectrum of a low-mass X-ray binary to date. Doppler tomography reveals intriguing transient structures present in the accretion disc and flow driven by modulation of the accretion rate, necessitating further characterization of the system at high temporal and spectral resolution. Our ephemeris corrects and supersedes previous ephemerides, and provides a factor three reduction in the number of templates in the search space, facilitating precision searches for continuous gravitational-wave emission from Sco X-1 throughout the upcoming LIGO/Virgo/KAGRA O4 observing run and beyond.more » « less
-
A device for measuring a plurality of material properties is designed to include accurate sensors configured to consecutively obtain thermal conductivity, electrical conductivity, and Seebeck coefficient of a single sample while maintaining a vacuum or inert gas environment. Four major design factors are identified as sample-heat spreader mismatch, radiation losses, parasitic losses, and sample surface temperature variance. The design is analyzed using finite element methods for high temperature ranges up to 1000°C as well as ultra-high temperatures up to 2500°C. A temperature uncertainty of 0.46% was estimated for a sample with cold and hot sides at 905.1 and 908.5°C, respectively. The uncertainty at 1000°C was calculated to be 0.7% for a ?T of 5°C between the hot and cold sides. The thermal conductivity uncertainty was calculated to be -8.6% at ~900°C for a case with radiative gains, and +8.2% at ~1000°C for a case with radiative losses, indicating the sensitivity of the measurement to the temperature of the thermal guard in relation to the heat spreader and sample temperature. Lower limits of -17 and -13% error in thermal conductivity measurements were estimated at the ultra-high temperature of ~2500°C for a single-stage and double-stage radiation shield, respectively. It is noted that this design is not limited to electro-thermal characterization and will enable measurement of ionic conductivity and surface temperatures of energy materials under realistic operating conditions in extreme temperature environments.more » « less
- Free Publicly Accessible Full Text
-
Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1149/2162-8777/ac861a
