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Title: Deformation Defects Characterization in Short-range Ordered CrCoNi using Fast Electron Detectors and 4D-STEM
Here, we introduce a novel defect imaging method based on the cepstral analysis of electron diffuse scattering using an Electron Microscope Pixel Array Detector (EMPAD) detector.  more » « less
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Publisher / Repository:
Oxford University Press
Date Published:
Journal Name:
Microscopy and Microanalysis
Page Range / eLocation ID:
251 to 253
Medium: X
Sponsoring Org:
National Science Foundation
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