Precisely targeted measurements of trace elements using laser ablation inductively coupled plasma mass spectrometry (LA-ICPMS) reveal inter-chamber heterogeneities in specimens of the planktic foraminifer
The ionization fraction is a key figure of merit for optimizing the performance of plasma device. This work presents an optical emission spectroscopy (OES) method to determine the ionization fraction in low-temperature xenon plasma. The emission line-ratio of xenon ionic and atomic 6
- NSF-PAR ID:
- 10495063
- Publisher / Repository:
- IOP Publishing
- Date Published:
- Journal Name:
- Plasma Sources Science and Technology
- Volume:
- 32
- Issue:
- 9
- ISSN:
- 0963-0252
- Page Range / eLocation ID:
- 095019
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1088/1361-6595/acfb37
