Graph Neural Networks (GNNs) are powerful machine learning prediction models on graph-structured data. However, GNNs lack rigorous uncertainty estimates, limiting their reliable deployment in settings where the cost of errors is significant. We propose conformalized GNN (CF-GNN), extending conformal prediction (CP) to graph-based models for guaranteed uncertainty estimates. Given an entity in the graph, CF-GNN produces a prediction set/interval that provably contains the true label with pre-defined coverage probability (e.g. 90%). We establish a permutation invariance condition that enables the validity of CP on graph data and provide an exact characterization of the test-time coverage. Besides valid coverage, it is crucial to reduce the prediction set size/interval length for practical use. We observe a key connection between non-conformity scores and network structures, which motivates us to develop a topology-aware output correction model that learns to update the prediction and produces more efficient prediction sets/intervals. Extensive experiments show that CF-GNN achieves any pre-defined target marginal coverage while significantly reducing the prediction set/interval size by up to 74% over the baselines. It also empirically achieves satisfactory conditional coverage over various raw and network features.
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Data-Efficient Conformalized Interval Prediction of Minimum Operating Voltage Capturing Process Variations
Accurate minimum operating voltage Vmin prediction is a critical element in manufacturing tests. Conventional methods lack coverage guarantees in interval predictions. Conformal Prediction (CP), a distribution-free machine learning approach, excels in providing rigorous coverage guarantees for interval predictions. However, standard CP predictors may fail due to a lack of knowledge of process variations. We address this challenge by providing principled conformalized interval prediction in the presence of process variations with high data efficiency, where the data from a few additional chips is utilized for calibration. We demonstrate the superiority of the proposed method on industrial 16nm chip data.
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- Award ID(s):
- 1956313
- PAR ID:
- 10521454
- Publisher / Repository:
- 61st ACM/IEEE Design Automation Conference (DAC ’24)
- Date Published:
- ISBN:
- 979-8-4007-0601-1
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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