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More than ever, ecologists seek to employ herbarium collections to estimate plant functional traits from the past and across biomes. However, many trait measurements are destructive, which may preclude their use on valuable specimens. Researchers increasingly use reflectance spectroscopy to estimate traits from fresh or ground leaves, and to delimit or identify taxa. Here, we extend this body of work to non-destructive measurements on pressed, intact leaves, like those in herbarium collections. Using 618 samples from 68 species, we used partial least-squares regression to build models linking pressed-leaf reflectance spectra to a broad suite of traits, including leaf mass per area (LMA), leaf dry matter content (LDMC), equivalent water thickness, carbon fractions, pigments, and twelve elements. We compared these models to those trained on fresh- or ground-leaf spectra of the same samples. The traits our pressed-leaf models could estimate best were LMA (R2 = 0.932; %RMSE = 6.56), C (R2 = 0.855; %RMSE = 9.03), and cellulose (R2 = 0.803; %RMSE = 12.2), followed by water-related traits, certain nutrients (Ca, Mg, N, and P), other carbon fractions, and pigments (all R2 = 0.514–0.790; %RMSE = 12.8–19.6). Remaining elements were predicted poorly (R2 < 0.5, %RMSE > 20). For most chemical traits, pressed-leaf models performed better than fresh-leaf models, but worse than ground-leaf models. Pressed-leaf models were worse than fresh-leaf models for estimating LMA and LDMC, but better than ground-leaf models for LMA. Finally, in a subset of samples, we used partial least-squares discriminant analysis to classify specimens among 10 species with near-perfect accuracy (>97%) from pressed- and ground-leaf spectra, and slightly lower accuracy (>93%) from fresh-leaf spectra. These results show that applying spectroscopy to pressed leaves is a promising way to estimate leaf functional traits and identify species without destructive analysis. Pressed-leaf spectra might combine advantages of fresh and ground leaves: like fresh leaves, they retain some of the spectral expression of leaf structure; but like ground leaves, they circumvent the masking effect of water absorption. Our study has far-reaching implications for capturing the wide range of functional and taxonomic information in the world’s preserved plant collections.
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This content will become publicly available on July 4, 2026
Seeing herbaria in a new light: leaf reflectance spectroscopy unlocks trait and classification modeling in plant biodiversity collections
Summary Reflectance spectroscopy is a rapid method for estimating traits and discriminating species. Spectral libraries from herbarium specimens represent an untapped resource for generating broad phenomic datasets across space, time, and taxa.We conducted a proof‐of‐concept study using trait data and spectra from herbarium specimens up to 179 yr old, alongside data from recently dried and pressed leaves. We validated model accuracy and transferability for trait prediction and taxonomic discrimination.Trait models from herbarium spectra predicted leaf mass per area (LMA) withR2 = 0.94 and %RMSE = 4.86%. Models for LMA prediction were transferable between herbarium and pressed spectra, achievingR2 = 0.88, %RMSE = 8.76% for herbarium to pressed spectra, andR2 = 0.76, %RMSE = 10.5% for the reverse transfer. Discriminant models classified leaf spectra from 25 species with 74% accuracy, and classification probabilities were significantly associated with several herbarium specimen quality metrics.The results validate herbarium spectral data for trait prediction and taxonomic discrimination, and demonstrate that trait modeling can benefit from the complementary use of pressed‐leaf and herbarium‐leaf spectral datasets. These promising advancements help to justify the spectral digitization of plant biodiversity collections and support their application in broad ecological and evolutionary investigations.
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- Award ID(s):
- 2021898
- PAR ID:
- 10632295
- Publisher / Repository:
- Wiley
- Date Published:
- Journal Name:
- New Phytologist
- ISSN:
- 0028-646X
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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