skip to main content
US FlagAn official website of the United States government
dot gov icon
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
https lock icon
Secure .gov websites use HTTPS
A lock ( lock ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.


Title: Cascade optical coherence tomography (C-OCT)
Significant advances for optical systems in terms of both performance and packaging are enabled by freeform optical components. Yet, surface form metrology for freeform optics remains a challenge. We developed and investigated a point-cloud cascade optical coherence tomography (C-OCT) technique to address this metrology challenge. The mathematical framework for the working principle of C-OCT is presented. A novel detection scheme is developed to enable high-speed measurements. Experimental results validate the C-OCT technique with the prototype setup demonstrating single-point precision of ±26 nm (∼λ/24 at the He-Ne wavelength), paving the way towards full surface measurements on freeform optical components.  more » « less
Award ID(s):
1822049 1822026
PAR ID:
10163972
Author(s) / Creator(s):
; ; ; ; ;
Publisher / Repository:
Optical Society of America
Date Published:
Journal Name:
Optics Express
Volume:
28
Issue:
14
ISSN:
1094-4087; OPEXFF
Format(s):
Medium: X Size: Article No. 19937
Size(s):
Article No. 19937
Sponsoring Org:
National Science Foundation
More Like this
  1. Freeform optical components enable dramatic advances for optical systems in both performance and packaging. Surface form metrology of manufactured freeform optics remains a challenge and an active area of research. Towards addressing this challenge, we previously reported on a novel architecture, cascade optical coherence tomography (C-OCT), which was validated for its ability of high-precision sag measurement at a given point. Here, we demonstrate freeform surface measurements, enabled by the development of a custom optical-relay-based scanning mechanism and a unique high-speed rotation mechanism. Experimental results on a flat mirror demonstrate an RMS flatness of 14 nm (∼λ/44 at the He-Ne wavelength). Measurement on a freeform mirror is achieved with an RMS residual of 69 nm (∼λ/9). The system-level investigations and validation provide the groundwork for advancing C-OCT as a viable freeform metrology technique. 
    more » « less
  2. Transverse translation-diverse phase retrieval (TTDPR), a ptychographic wavefront-sensing technique, is a viable method for optical surface metrology due to its relatively simple hardware requirements, flexibility, and high demonstrated accuracy in other fields. In TTDPR, a subaperture illumination pattern is scanned across an optic under test, and the reflected intensity is gathered on an array detector near focus. A nonlinear optimization algorithm is used to reconstruct the wavefront aberration at the test surface, from which we can solve for surface error, using intensity patterns from multiple scan positions. TTDPR is an advantageous method for aspheric and freeform metrology, because measurements can be performed without null optics. We report on a sensitivity analysis of TTDPR using simulations of a freeform concave mirror measurement. Simulations were performed to test TTDPR algorithmic performance as a function of various parameters, including detector SNR and position uncertainty of the illumination. 
    more » « less
  3. Vision ray techniques are known in the optical community to provide low-uncertainty image formation models. In this work, we extend this approach and propose a vision ray metrology system that estimates the geometric wavefront of a measurement sample using the sample-induced deflection in the vision rays. We show the feasibility of this approach using simulations and measurements of spherical and freeform optics. In contrast to the competitive technique deflectometry, this approach relies on differential measurements and, hence, requires no elaborated calibration procedure that uses sophisticated optimization algorithms to estimate geometric constraints. Applications of this work are the metrology and alignment of freeform optics. 
    more » « less
  4. Kress, Bernard C; Peroz, Christophe (Ed.)
    Metaforms are novel optical components formed by conforming a metasurface to a freeform substrate. Metaforms can be a powerful solution when designing compact imaging systems such as augmented reality displays. Given the rotationally variant nature of the metaform substrate and the difficulty of metasurface fabrication on curved substrates, the proper alignment of the metasurface nanofeatures to the freeform substrate is essential. Thus, to seamlessly bridge the metaform design, manufacturing, and metrology, we developed a software tool that automatically generates ISO standard highaccuracy CAD models for the designed metaform components. 
    more » « less
  5. A recently reported vision ray metrology technique [Opt. Express29,43480(2021)OPEXFF1094-408710.1364/OE.443550] measures geometric wavefronts with high precision. This paper introduces a method to convert these wavefront data into height information, focusing on the impact of back surface flatness and telecentricity errors on measurement accuracy. Systematic errors from these factors significantly affect height measurements. Using ray trace simulations, we estimate reconstruction errors with various plano-concave and plano-convex elements. We also developed a calibration technique to mitigate telecentricity errors, achieving submicron accuracy in surface reconstruction. This study provides practical insights into vision ray metrology systems, highlighting validity limits, emphasizing the importance of calibration for larger samples, and establishing system alignment tolerances. The reported technique for the conversion of geometric wavefronts to surface topography employs a direct non-iterative ray-tracing-free method. It is ideally suited for reference-free metrology with application to freeform optics manufacturing. 
    more » « less