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Title: Can automated program repair refine fault localization? a unified debugging approach
A large body of research efforts have been dedicated to automated software debugging, including both automated fault localization and program repair. However, existing fault localization techniques have limited effectiveness on real-world software systems while even the most advanced program repair techniques can only fix a small ratio of real-world bugs. Although fault localization and program repair are inherently connected, their only existing connection in the literature is that program repair techniques usually use off-the-shelf fault localization techniques (e.g., Ochiai) to determine the potential candidate statements/elements for patching. In this work, we propose the unified debugging approach to unify the two areas in the other direction for the first time, i.e., can program repair in turn help with fault localization? In this way, we not only open a new dimension for more powerful fault localization, but also extend the application scope of program repair to all possible bugs (not only the bugs that can be directly automatically fixed). We have designed ProFL to leverage patch-execution results (from program repair) as the feedback information for fault localization. The experimental results on the widely used Defects4J benchmark show that the basic ProFL can already at least localize 37.61% more bugs within Top-1 than state-of-the-art spectrum and mutation based fault localization. Furthermore, ProFL can boost state-of-the-art fault localization via both unsupervised and supervised learning. Meanwhile, we have demonstrated ProFL's effectiveness under different settings and through a case study within Alipay, a popular online payment system with over 1 billion global users.  more » « less
Award ID(s):
1942430 1763906
PAR ID:
10175524
Author(s) / Creator(s):
; ; ; ; ; ;
Date Published:
Journal Name:
ACM SIGSOFT International Symposium on Software Testing and Analysis
Page Range / eLocation ID:
75 to 87
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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