skip to main content


Title: Trapping processes and band discontinuities in Ga2O3 FinFETs investigated by dynamic characterization and optically-assisted measurements
Award ID(s):
1719875
NSF-PAR ID:
10325883
Author(s) / Creator(s):
; ; ; ; ; ; ; ; ; ; ;
Editor(s):
Teherani, Ferechteh H.; Look, David C.; Rogers, David J.
Date Published:
Journal Name:
PROCEEDINGS OF SPIE
Page Range / eLocation ID:
10
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
More Like this
No document suggestions found