Trapping processes and band discontinuities in Ga2O3 FinFETs investigated by dynamic characterization and optically-assisted measurements
- Award ID(s):
- 1719875
- NSF-PAR ID:
- 10325883
- Editor(s):
- Teherani, Ferechteh H.; Look, David C.; Rogers, David J.
- Date Published:
- Journal Name:
- PROCEEDINGS OF SPIE
- Page Range / eLocation ID:
- 10
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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