Trapping processes and band discontinuities in Ga2O3 FinFETs investigated by dynamic characterization and optically-assisted measurements
- Editors:
- Teherani, Ferechteh H.; Look, David C.; Rogers, David J.
- Award ID(s):
- 1719875
- Publication Date:
- NSF-PAR ID:
- 10325883
- Journal Name:
- PROCEEDINGS OF SPIE
- Page Range or eLocation-ID:
- 10
- Sponsoring Org:
- National Science Foundation
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