skip to main content

Title: Trapping processes and band discontinuities in Ga2O3 FinFETs investigated by dynamic characterization and optically-assisted measurements
Authors:
; ; ; ; ; ; ; ; ; ; ;
Editors:
Teherani, Ferechteh H.; Look, David C.; Rogers, David J.
Award ID(s):
1719875
Publication Date:
NSF-PAR ID:
10325883
Journal Name:
PROCEEDINGS OF SPIE
Page Range or eLocation-ID:
10
Sponsoring Org:
National Science Foundation
More Like this
No document suggestions found