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Abstract There is an urgent need for developing collaborative process-defect modeling in metal-based additive manufacturing (AM). This mainly stems from the high volume of training data needed to develop reliable machine learning models for in-situ anomaly detection. The requirements for large data are especially challenging for small-to-medium manufacturers (SMMs), for whom collecting copious amounts of data is usually cost prohibitive. The objective of this research is to develop a secured data sharing mechanism for directed energy deposition (DED) based AM without disclosing product design information, facilitating secured data aggregation for collaborative modeling. However, one major obstacle is the privacy concerns that arise from data sharing, since AM process data contain confidential design information, such as the printing path. The proposed adaptive design de-identification for additive manufacturing (ADDAM) methodology integrates AM process knowledge into an adaptive de-identification procedure to mask the printing trajectory information in metal-based AM thermal history, which otherwise discloses substantial printing path information. This adaptive approach applies a flexible data privacy level to each thermal image based on its similarity with the other images, facilitating better data utility preservation while protecting data privacy. A real-world case study was used to validate the proposed method based on the fabrication of two cylindrical parts using a DED process. These results are expressed as a Pareto optimal solution, demonstrating significant improvements in privacy gain and minimal utility loss. The proposed method can facilitate privacy improvements of up to 30% with as little as 0% losses in dataset utility after de-identification.
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This content will become publicly available on November 7, 2025
Ontology-guided Data Sharing and Federated Quality Control with Differential Privacy in Additive Manufacturing
Abstract The scarcity of measured data for defect identification often challenges the development and certification of additive manufacturing processes. Knowledge transfer and sharing have become emerging solutions to small-data challenges in quality control to improve machine learning with limited data, but this strategy raises concerns regarding privacy protection. Existing zero-shot learning and federated learning methods are insufficient to represent, select, and mask data to share and control privacy loss quantification. This study integrates differential privacy in cybersecurity with federated learning to investigate sharing strategies of manufacturing defect ontology. The method first proposes using multilevel attributes masked by noise in defect ontology as the sharing data structure to characterize manufacturing defects. Information leaks due to the sharing of ontology branches and data are estimated by epsilon differential privacy (DP). Under federated learning, the proposed method optimizes sharing defect ontology and image data strategies to improve zero-shot defect classification given privacy budget limits. The proposed framework includes (1) developing a sharing strategy based on multilevel attributes in defect ontology with controllable privacy leaks, (2) optimizing joint decisions in differential privacy, zero-shot defect classification, and federated learning, and (3) developing a two-stage algorithm to solve the joint optimization, combining stochastic gradient descent search for classification models and an evolutionary algorithm for exploring data-sharing strategies. A case study on zero-shot learning of additive manufacturing defects demonstrated the effectiveness of the proposed method in data-sharing strategies, such as ontology sharing, defect classification, and cloud information use.
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- Award ID(s):
- 1901109
- PAR ID:
- 10555909
- Publisher / Repository:
- American Society of Mechanical Engineers
- Date Published:
- Journal Name:
- Journal of Computing and Information Science in Engineering
- ISSN:
- 1530-9827
- Page Range / eLocation ID:
- 1 to 15
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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